Philip
Siegmann
Profesor/a Titular Universidad
Universidad Autónoma de Madrid
Madrid, EspañaPublicaciones en colaboración con investigadores/as de Universidad Autónoma de Madrid (2)
2004
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Comparison between optical techniques and confocal microscopy for defect detection on thin wires
Applied Surface Science
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Static and dynamic detection of axial surface defects on metallic wires by conical triple laser reflection
Optics and Lasers in Engineering, Vol. 42, Núm. 2, pp. 203-218