Characterization of the resonant third-order nonlinear susceptibility of Si-doped GaN/AlN quantum wells and quantum dots at 1.5 μm
- Valdueza-Felip, S.
- Naranjo, F.B.
- González-Herráez, M.
- Fernández, H.
- Solis, J.
- Guillot, F.
- Monroy, E.
- Tchernycheva, M.
- Nevou, L.
- Julián, F.H.
Konferenzberichte:
Optics InfoBase Conference Papers
ISSN: 2162-2701
Datum der Publikation: 2008
Art: Konferenz-Beitrag