Structural and optical characterization of thick InGaN layers and InGaN/GaN MQW grown by molecular beam epitaxy

  1. Naranjo, F.B.
  2. Fernández, S.
  3. Sánchez-García, M.A.
  4. Calle, F.
  5. Calleja, E.
  6. Trampert, A.
  7. Ploog, K.H.
Aldizkaria:
Materials Science and Engineering B: Solid-State Materials for Advanced Technology

ISSN: 0921-5107

Argitalpen urtea: 2002

Alea: 93

Zenbakia: 1-3

Orrialdeak: 131-134

Mota: Biltzar ekarpena

DOI: 10.1016/S0921-5107(02)00032-6 GOOGLE SCHOLAR