Structural and optical characterization of thick InGaN layers and InGaN/GaN MQW grown by molecular beam epitaxy

  1. Naranjo, F.B.
  2. Fernández, S.
  3. Sánchez-García, M.A.
  4. Calle, F.
  5. Calleja, E.
  6. Trampert, A.
  7. Ploog, K.H.
Revue:
Materials Science and Engineering B: Solid-State Materials for Advanced Technology

ISSN: 0921-5107

Année de publication: 2002

Volumen: 93

Número: 1-3

Pages: 131-134

Type: Communication dans un congrès

DOI: 10.1016/S0921-5107(02)00032-6 GOOGLE SCHOLAR
La source de données: Scopus