Reduction of vibration-induced errors in 3D measurement systems with vision and structured light
- Luna, C.A.
- Mazo, M.
- Lázaro, J.L.
- Vázquez, J.F.
- Ureña, J.
- García, J.J.
- Sarmiento, H.
Proceedings:
IEEE International Symposium on Industrial Electronics
ISBN: 9780780387386
Year of publication: 2005
Volume: III
Pages: 1291-1296
Type: Conference paper