Reduction of vibration-induced errors in 3D measurement systems with vision and structured light

  1. Luna, C.A.
  2. Mazo, M.
  3. Lázaro, J.L.
  4. Vázquez, J.F.
  5. Ureña, J.
  6. García, J.J.
  7. Sarmiento, H.
Actas:
IEEE International Symposium on Industrial Electronics

ISBN: 9780780387386

Ano de publicación: 2005

Volume: III

Páxinas: 1291-1296

Tipo: Achega congreso

DOI: 10.1109/ISIE.2005.1529111 GOOGLE SCHOLAR
Fonte de datos: Scopus